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INFRARED DETECTOR MCT photoconductive detector P3257/P3981/P2750 series Non-cooled type and TE-cooled type suitable for long, continuous operation Features The band gap can be adjusted by controlling the composition ratio of HgTe and CdTe. Utilizing this fact, various types are available in different spectral characteristics. l Photoconductive element that decreases its resistance by input of infrared light l Custom devices available Custom devices not listed in this catalog are also available with different spectral response, active area size and number of element. l Easy-to-use infrared detector modules with preamp available Applications l Choice of spectral response (up to 12 m) l Radiation thermometer l Gas analyzer l Infrared spectrophotometer l FTIR l CO2 laser monitor Accessories (Optional) l Heatsink for two-stage TE-cooler A3179-01 (Can also be used with P3257-31) l Heatsink for three-stage TE-cooler A3179-04 l Temperature controller C1103-05 (-25 to -75 C) C1103-07 (20 to -30 C) l Preamp C5185-01 (P3981/P2750 series) (Preamp for P3257-30/-31 available upon request) l Infrared detector modules with preamp P4631-10 (P3257-31) P4631 (P3981) P4631-04 (P2750) A bsolute m axim um ratings Therm istor TE -cooler O perating S torage A llowable power allowable tem perature tem perature current dissipation current Topr Tstg (m W ) (A ) (m A ) (C ) (C ) 50 1.5 0.2 1.0 50 3 3 6 6 3 -40 to +60 -55 to +60 s G eneral ratings / Absolute m axim um ratings D im e nsiona l outline / W indow m a terial * 1 /S e A ctive area Type N o. Package C ooling (m m ) w ith BN C c onnec tor N on-cooled O n e -s ta g e TO -8 P 3257-31 /S e T E -c o o le d /S TO -8 P 3981 1x1 T w o -s ta g e TO -66 P 3981-01 /S T E -c o o le d /S TO -8 P 2750-08 T h re e -s ta g e P 2750 TO -3 /S T E -c o o le d 0 .2 5 x 0 .2 5 P 2750-06 *1: W indow m aterial S : S apphire glass S e: ZnS e P 3257-30 s E lectrical and optical characteristics (Typ. unless otherw ise noted) M easure m e nt P eak P hoto condition C ut-off sensitivity sensitivity * 2 wavelength E le m e n t wavelength S c te m p e ra tu re p =p * 3 T (C ) 25 0 ( m ) 6.5 7.0 ( m ) 11.0 11.5 (V /W ) 2 x 10 -3 5 x 10 -3 D (500, 1200, 1) * 4 D 1200, 1) NEP =p * 3 D a rk R ise tim e re sis ta n c e tr 0 to 63 % Rd Type N o. (p *3, P 3257-30 P 3257-31 P 3981 3.6 4.3 1 x 10 4 5.0 x 10 8 5.0 x 10 9 1.3 x 10 11 -30 P 3981-01 2 P 2750-08 3.0 x 10 8 3.0 x 10 9 1.5 x 10 10 4.8 5.4 3 x 10 3 P 2750 2 x 10 -60 4.8 5.5 1.0 x 10 9 9.0 x 10 9 4.5 x 10 10 3 x 10 3 P 2750-06 *2: P hoto sensitivity changes with the bias current. The values in the above table are m easured *3: P 3257-30/-31: =10.6 m *4: P 3257-30/-31: (800, 1200, 1) M in. Typ. (cm *H z 1/2 /W ) (cm *H z 1/2 /W ) (cm *H z 1/2 /W ) (W /H z 1/2 ) 5.0 x 10 5 3.0 x 10 6 2.0 x 10 5 5.0 x 10 -7 6 6.0 x 10 6 5 1.0 x 10 5.0 x 10 2.0 x 10 -7 7.7 x 10 -13 10 -12 ( s) 1 (ns) 1 (ns) 10 ( ) 30 35 600 6.7 x 2 160 2.2 x 10 -12 3 200 5.0 x 10 -13 with the optim um bias current. 1 MCT photoconductive detector s Spectral response P3257-30/-31 10 8 P3257/P3981/P2750 series P3981/-01 (Typ.) 10 12 (Typ.) D* (, 1200, 1) (cm * Hz2 /W) P3257-31 (T=0 C) 10 7 D* (, 1200, 1) (cm * Hz1/2/W) 1 10 11 T= -30 C P3257-30 (T=25 C) 10 6 10 10 T=0 C 10 5 10 2 3 4 5 6 7 8 9 10 11 12 9 2 3 4 5 WAVELENGTH (m) KIRDB0164EC WAVELENGTH (m) KIRDB0066EC P2750/-06/-08 10 11 s D* vs. element temperature (Typ.) 1011 P3981 (Typ.) P2750/-06 (T= -60 C) D* (, 1200, 1) (cm * Hz1/2/W) D* (, 1200, 1) (cm * Hz 2 /W) P2750 10 10 10 10 P2750-08 (T= -30 C) 109 1 109 108 2 3 4 5 6 108 -80 -60 -40 -20 0 20 40 WAVELENGTH (m) KIRDB0068EC ELEMENT TEMPERATURE (C) KIRDB0174EA s S/N vs. bias current (P2750) 10 D* 9 (Typ.) s Cooling characteristics of TE-cooler 40 [Typ. Ta=25 C, thermal resistance of heatsink=3 C/W (one and two-stage TE-cooled), 1.2 C/W (three-stage TE-cooled)] ELEMENT TEMPERATURE (C) 8 20 ONE-STAGE TE-COOLED TYPE TWO-STAGE TE-COOLED TYPE (TO-8) RELATIVE VALUE 7 6 5 4 3 N 2 1 0 S 0 -20 -40 TWO-STAGE TE-COOLED TYPE (TO-66) -60 THREE-STAGE TE-COOLED TYPE -80 0 1 2 3 4 5 0 0.4 0.8 1.2 1.6 CURRENT (mA) KIRDB0070EC CURRENT (A) KIRDB0175EA The detector must be operated in a range where the D* becomes Max. 2 MCT photoconductive detector s Current vs. voltage of TE-cooler 1.6 1.4 [Typ. Ta=25 C, thermal resistance of heatsink=3 C/W (one and two-stage TE-cooler), 1.2 C/W (three-stage TE-cooler)] P3257/P3981/P2750 series s Thermistor temperature characteristic 1 M (Typ.) SENSOR RESISTANCE 1.2 ONE-STAGE TE-COOLED TYPE CURRENT (A) 100 k 1.0 0.8 0.6 0.4 0.2 0.0 TWO-STAGE TE-COOLED TYPE 0 0.5 1.0 1.5 2.0 2.5 THREE-STAGE TE-COOLED TYPE 10 k 1 k -80 -60 -40 -20 0 20 40 VOLTAGE (V) KIRDB0176EC ELEMENT TEMPERATURE (C) KIRDB0071EB s Measurement circuit CHOPPER 1200 Hz BAND-PASS FILTER r.m.s. METER DETECTOR BLACK BODY 500 K fo=1200 Hz f=120 Hz INCIDENT ENERGY: 2.64 W/cm2 KIRDC0005EA s Connection example (P3981) CABLE (SUPPLIED WITH C5185) BNC CONNECTOR CABLE (SOLD SEPARATELY) P3981 + A3179-01 DETECTOR & HEATSINK POWER SUPPLY FOR AMP C5185-01 AMP LOCK-IN AMP OR SPECTRUM ANALYZER SIGNAL PROCESSING CIRCUIT C1103-05 TEMPERATURE CONTROLLER C4696 CHOPPER CABLE (SUPPLIED WITH C1103-05) Connect C1103-05 and power supply ground wires together. KIRDC0006EB BNC CONNECTOR CABLE (SOLD SEPARATELY) 3 MCT photoconductive detector s Dimensional outlines (unit: mm) P3257-30 54.0 20 5 9.0 41.2 1.3 P3257/P3981/P2750 series P3257-31, P3981, P2750-08 15.3 0.2 14 0.2 11.7 20 KIRDA0121EA 0.45 LEAD 10.2 0.2 12 MIN. DETECTOR DETECTOR TE-COOLER (-) TE-COOLER (+) THERMISTOR P3257-31 P3981, P2750-08 a 5.2 0.2 5.0 PHOTOSENSITIVE SURFACE BNC CONNECTOR PHOTOSENSITIVE SURFACE 5.1 0.2 a 10 0.2 WINDOW 10 0.2 5.1 0.2 6.6 0.2 KIRDA0122EA P3981-01 32 MAX. 24.4 0.2 P2750/-06 39 0.2 30.1 0.1 17 0.4 3.7 WINDOW 10 0.1 PHOTOSENSITIVE SURFACE 14 0.1 4 11 0.5 5.1 0.2 19.4 0.2 5.0 0.2 25.4 0.2 PHOTOSENSITIVE WINDOW 10 0.2 SURFACE 1.6 0.1 91 25 MAX. 3.5 MAX. 9 0.2 PUMP-OUT PIPE PUMP-OUT PIPE 5 MAX. 12.7 0.2 40 36 40 KIRDA0123EB 40 40 THERMISTOR DETECTOR DETECTOR TE-COOLER (-) TE-COOLER (+) 25 MAX. 1.0 LEAD 12 1 2.0 11.6 0.2 TE-COOLER (+) DETECTOR THERMISTOR PUMP-OUT PIPE NC TE-COOLER (-) 40 KIRDA0045ED Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies or omissions. Specifications are subject to change without notice. No patent rights are granted to any of the circuits described herein. (c)2007 Hamamatsu Photonics K.K. HAMAMATSU PHOTONICS K.K., Solid State Division 1126-1 Ichino-cho, Higashi-ku, Hamamatsu City, 435-8558 Japan, Telephone: (81) 53-434-3311, Fax: (81) 53-434-5184, www.hamamatsu.com U.S.A.: Hamamatsu Corporation: 360 Foothill Road, P.O.Box 6910, Bridgewater, N.J. 08807-0910, U.S.A., Telephone: (1) 908-231-0960, Fax: (1) 908-231-1218 Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-82211 Herrsching am Ammersee, Germany, Telephone: (49) 08152-3750, Fax: (49) 08152-2658 France: Hamamatsu Photonics France S.A.R.L.: 19, Rue du Saule Trapu, Parc du Moulin de Massy, 91882 Massy Cedex, France, Telephone: 33-(1) 69 53 71 00, Fax: 33-(1) 69 53 71 10 United Kingdom: Hamamatsu Photonics UK Limited: 2 Howard Court, 10 Tewin Road, Welwyn Garden City, Hertfordshire AL7 1BW, United Kingdom, Telephone: (44) 1707-294888, Fax: (44) 1707-325777 North Europe: Hamamatsu Photonics Norden AB: Smidesvagen 12, SE-171 41 Solna, Sweden, Telephone: (46) 8-509-031-00, Fax: (46) 8-509-031-01 Italy: Hamamatsu Photonics Italia S.R.L.: Strada della Moia, 1/E, 20020 Arese, (Milano), Italy, Telephone: (39) 02-935-81-733, Fax: (39) 02-935-81-741 Cat. No. KIRD1025E09 Jul. 2007 DN 4 |
Price & Availability of P3257-30 |
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